Scanning electron microscope with auto-emission gun KYKY-EM8000F

Scanning electron microscope with KYKY-EM8000F auto-emission gun
Introduction
Scanning electron microscopy (SEM) is a method of studying the morphology of a microscope between a transmission electron microscope and an optical microscope.It can directly use the material properties of the sample surface to produce microscopic images.

Characteristic
Auto-emission Schottky electron gun, high brightness, good monochromaticity, small spot of electron beam, long service life
Maintains good brightness and high resolution at low accelerating voltages
High beam stability and small dispersion, suitable for long-term accurate analysis, such as BSE, EDS, non-conductive
samples with low accelerating voltage can be directly observed without the need for gold spraying
Easy to operate, all EM operations can be performed with the mouse.
It is possible to configure electronic optical systems, sampling stations, etc. Resolution

Technical parameters
Resolution: 1.5 nm (15 kV);5 nm (3 kV)
Magnification: 15~500,000 times
Acceleration voltage: 0~30 kV
Electronic cannon: auto-emission Schottky-Schottky electronic cannon
Automatic adjustment function: focus, brightness/contrast, astigmatism, electron beam pair medium
Vacuum system: Secondary electron detector in high vacuum (with the function of protecting the detector sensor from collision)
Moving the sample
X: 0~80mm
Y: 0~60mm
Z: 0~50mm
R: 360 °
T: -5 ° ~ 90 °
Detector: SE detector, BSE detector (optional), X-ray spectrometer (optional), EBSD (optional)

Detailed technical description
1. Working conditions:
Power supply:
1.1 230 V (+/ - 6% and 10%) / 50 Hz (+/ - 1%). An uninterruptible power supply of the UPS is required.
1.2 Operating time ambient temperature: 17-23 °C
1.3 operating time: relative humidity <80% (non-condensing)
1.4 Noise: <68 dB
1.5 The durability of the tool can work continuously
2. Application:
It is mainly used to analyze the appearance of the surface of samples. Equipped with an energy spectrum, which is used for composition analysis, and equipped with a small ion sputtering device to assist in sample surface treatment.
3. Technical specifications
1) Secondary Electronic Image Resolution (SE): 1.5 nm at 15 kV or 30 kV
2). Magnification: 15-500,000 x
3). Accelerating voltage: 0~30 kV
4. Electronic gun: Schottky auto-emission gun;
Automatic adjustment function: focusing, brightness/contrast, astigmatism, dynamic focusing, electron beam on the carrier.
5. Tube
High performance lens system
Lens aperture: They can be adjusted outside the vacuum chamber, and the lens aperture can be replaced without removing the lens frame.
6. Vacuum system
2 ion pumps, 1 turbomolecular pump and a mechanical pump; the vacuum in the sample chamber is better than 6 x 10-4 Pa, the vacuum in the electron gun is better than 1 x 10 -6 Pa. Fully automatic vacuum control with vacuum locking functions.
7. Detector
High vacuum secondary electron detector.
8. Sample stage
Mobile: X ≥ 50 mm, Y ≥ 50 mm, Z ≥ 25 mm
Rotation: 360 ° continuous
Tilt: - 5°~90°
9. Image Processor
Maximum 16384 x 16384 pixels
Image file formats: .TIFF
Automatic digital movie recording: Function (AVI)
10 Image display: 19-inch LCD monitor
On average 256 frames or integral, rich and detailed image levels, real-time display magnification, zoom, accelerating voltage, displaying all kinds of gray curves.
11. accessories
The KYKY EM 8000F has six pre-assembled interfaces for all types of electronic detectors, SE detector, BES detector, X-ray EDS, EBS, etc
. One set of consumables and tools is included in the delivery.