Point of contact with the X-ray tube, Mo/Rh/W/Ag (optional), 50 kVp, 1 MAC detection system, Si-Pin diode (optional: SDD, FSDD)Energy resolution of the SI-Pin diode: 149 eV at half-height at Mn Ka / Option: SDD (125 eV), FSDD (122 eV)Collimator Collimator 0.3 (optional: 0,05, 0,1, 0,2, 0,5, 1 mm) Capillary optics 50 microns Manual/ automatic stage change Detection element I (22) ~ U (92)Sample type Solid / Liquid/powder, multilayer Chamber size for samples 660 mm X 450 mm X 150 mm / 500 mm X 450 mm X 150 mm Possible distance of moving the slide table 300 mm X 200 mm X 150 mm / 220 mm X 200 mm X 150 mm Sample table size 310 mm X 260 mm Key feature Automatic/ manual scene mode Coating thickness measurement: General, Rh, Pd, Au, Ag, Sn, Ni Measuring the thickness of multilayer thin films (up to 5 layers) Magnification of the camera 40~80xsafety 3-point blocking of the reportExcel, PDF / output Custom Form Key advantages Measuring the thickness of multilayer thin films (up to 5 layers) Convenient stage management Multipoint measurement is possible RoHS screening (optional) Remote support via the Internet Application verification of products for compliance with international environmental standards (Complies with RoHS, WEEE, ELV) Hazardous materials (Cr, Br, Cd, Hg, Pb, Cl, Sb, Sn, S) Sorting equipment Coating analysis of automotive parts, Electronic circuit board (PCB), for example, capacitor Analysis of single-layer, multi-layer, alloyed coating The thickness with the composition ratio can be measured over time in the metallization of the alloy
