The EDX3600L device is designed by Skyray to measure the content of Na2O, MgO, Al2O3, CaO, Fe2O3, K2O, MnO, SiO 2, TiO 2, As, Cr, Cu, Co, Mn, Ni, Pb, Ti, V, Zn, Zr, Ba in archaeological samples, paints and coatings on ancient ceramics and porcelain. The instrument is calibrated according to the standards provided by well-known research institutes, the Chinese Museum of History and the Shanghai Silicate Research Institute. By linking to the databases of ancient pottery and the database of ancient porcelain, the EDX3600L determines the period of production and the source of the sample under study. In addition, its super large sample chamber, specially built for the archaeological industry, can accommodate samples of large sizes and various shapes, and use the property of non-destructive analysis of X-ray spectrometers. EDX3600L, can be used not only as a ceramic tester, but also as an analyzer of the composition of bronze products (Cu, Sn, Pb, Zn, etc.) and precious metals (gold, platinum, silver, lead, copper, nickel, Ru, Rh and Fe), as well as measuring the thickness of metal coatings, it is multifunctional and indispensable for archaeological research.
Operational characteristics
Provides the possibility of professional elemental analysis of cement, steel, minerals, coating thickness and hazardous elements (RoHS)
Built-in SNE improves signal processing ability up to 25 times
Electrically cooled UHRD detector
Vacuum chamber
The air must be pumped out of the sample chamber using a vacuum pump when testing the sample for light elements with low content
The vacuum pump is supplied complete with a spectrometer
Maximum vacuum: 6 x 10-2Pa
Rotation speed: 1400rpm
Suction speed: 1 l/sec
Pump power: 0.25 kW
Large sample chamber
Triple radiation leakage protection mode
Independent correction model of matrix effects
Multivariate nonlinear regression procedure
Additional arbitrary analysis and identification of the model
Electrical block diagram with high signal-to-noise ratio
Highly efficient X-ray tube
Professional software for X-ray fluorescence analysis for multi-element measurements
Automatic change of collimators and filters
Technical Specifications
Measuring range: 1PPM-99.99%
Accuracy of determination of the deposition thickness: 0.005um
Testing time: 60--300 sec.
Accuracy: 0.05% (above 96%)
The range of elements: Na~U, the detection limits of RoHS analysis by Cd,Pd,Cr,Hg,Br reach 1PPM
