Trace Element Analyzer high-precision X-ray spectrometer SUPER XRF 2400
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A special optical scheme using secondarily reflected photoelectrons improves the signal-to-noise ratio, allows achieving lower detection limits, which makes it possible to analyze trace elements. The specialized cooling system makes the instrument more reliable and the results more reproducible. The vacuum system makes it possible to accurately analyze light elements: Na, Mg, Al, Si, P.
A special optical circuit using secondarily reflected photoelectrons improves the signal-to-noise ratio, allows achieving lower detection limits, which makes it possible to analyze trace elements. The specialized cooling system makes the instrument more reliable and the results more reproducible. The vacuum system makes it possible to accurately analyze light elements: Na, Mg, Al, Si, P
Operational characteristics
A special optical path scheme using changing primary targets
The original optical path system meets the requirements of testing various trace elements in the matrix, amplifies the signal/noise and reduces the detection limits
of 400W the power supply of the X-ray tube allows for a higher counting rate of excited photoelectrons. Detection limits are one level lower than with general EDXRF analyzers, and are more suitable for testing trace elements
Digital multi-channel technologies improve counting speeds up to 100kcps, improving test accuracy and reducing test time
The oil cooling system provides cooling of the X-ray source, which makes the device more stable
The optical shutter is used for frequent openings/closures of the power supply of the X-ray tube and the high-pressure system, which in turn affects the stability of the tests. Equipped with an optical shutter, the spectrometer maintains a high voltage, increasing the stability of the device
Vacuum system for testing light elements
The automatic sampling system allows for sequential analysis of 12 samples, each time, significantly increasing the efficiency of work
Technical specifications
Range of measured elements: from Na to U
Multiple switchable analysis modes: conventional XRD and secondary photoelectronic analysis
Content range: 0.1ppm to 99.99%
Lower detection limit: 0.1 ppm
The spectrometer significantly improves the detection limits of hazardous elements compared to a conventional desktop XRF spectrometer.
Repeatability: 0.1%
Stability: 0.1%
Ambient temperature: 15 to 30 C
Power supply: AC 220V ± 5V. AC.
Dimensions: 752 x 988 x 759 mm
Standard configuration
X-ray source, two sample excitation systems
Varian X-ray camera with 400W power and oil cooling system
Automatic switch of collimators and filters
Sample chamber with camera
HD CCD camera with high resolution
UHRD Krmenium Detector (SDD)
Automatic turret for samples for 12 positions
High-voltage voltage source
Professional RFA software
Scope of application
Analysis of micro-elements in the metallurgical industry, analysis of traces of hazardous elements in metals
Ecological analysis of traces of heavy metals in soil, air, water and other media
Analysis of traces of heavy metal elements in polymer films of the finished product
Analysis of elements harmful to the human body in the precious metals industry
Analysis of traces of rare earth metals
Analysis of the thickness of sub-nanometer deposition in the metal coating industry
Analysis of traces of harmful elements in various consumer goods, as well as toys
