The EDX 3600B X-ray fluorescence spectrometer is used in full elemental analysis, research work, has a high resolution, large camera.The EDX3600B X-ray fluorescence spectrometer uses XRD technology for fast and accurate elemental analysis of cement and steel. Features of low-energy X-ray technology with good excitation results of light elements such as Si, S, Na and Mg are widely used in spectrometry. In addition, the short analysis time and testing efficiency has improved significantly with the use of modern electronics. The device is equipped with a UHRD silicon detector, which leads to good linearity in energy, excellent energy resolution, high spectrum and high peak/background ratio. Thanks to the automatic spectrum stabilization device, the device allows you to get well-reproducible results. The method of eliminating the interference of spectra is used, the initial spectrum can be separated, and the concentration of light elements Si, S, Al, etc. is measured. Due to the use of the linear regression method and the reduction of the influence matrix, the effects of absorption and expansion between elements are significantly reduced.
Operational characteristics Provides the possibility of professional elemental analysis of cement, steel, minerals, coating thickness and hazardous elements (RoHS) Built-in SNE improves signal processing ability up to 25 times Electrically cooled UHRD detector Vacuum chamber The air must be pumped out of the sample chamber using a vacuum pump when testing the sample for light elements with low content The vacuum pump is supplied complete with a spectrometer Maximum vacuum: 6 x 10-2Pa Rotation speed: 1400rpm Suction speed: 1 l/sec Pump power: 0.25 kW Large sample chamber Triple radiation leakage protection mode Independent correction model of matrix effects Multivariate nonlinear regression procedure Additional arbitrary analysis and identification of the model Electrical block diagram with high signal-to-noise ratio Highly efficient X-ray tube Professional software for X-ray fluorescence analysis for multi-element measurements Automatic change of collimators and filters Technical Specifications Measuring range: 1PPM-99.99% Accuracy of determination of the deposition thickness: 0.005um Testing time: 60--300 sec. Accuracy: 0.05% (above 96%) The range of elements: Na~U, the detection limits of RoHS analysis by Cd,Pd,Cr,Hg,Br reach 1PPM Measured substances: powdery, solid, liquid substances Voltage: 15~50kV Pipe electric current: 50~1000uA Weight: about 80 kg Power: 50W Semiconductor detector with electric cooling system Improved sensor for metal research Relative humidity: <70% Voltage: AC 100V/220V Standard configuration Vacuum sealed sample chamber Silicon SDD Detector Electrical Circuit Signal Detection Electronics Built-in high-resolution CCD camera High and low voltage power supply Software X-ray tube Scope of application, analysis: Scientific research, quantitative and qualitative analysis of substances, routine studies, RoHS analysis, coating and spraying studies, analysis of heavy metals in soils, water, air; diagnostics and detection of defects in wear products, determination of trace elements in blood, etc., analysis in the control of raw materials, production technologies, production quality control, food quality control products and heavy metals in products, geological analysis, mineral research and analysis, identification of precious metals: gold, silver, platinum, etc, quality monitoring and quality control in the production of structural materials, such as cement, glass, forensic medical examination and technical assessment in security systems, environmental studies, archaeology, chemistry, electronics, and much more.
