The point of the X-ray tube is the Mo/Rh/W/Ag (optional), 50 kVp, 1 FSDD detection system (Fast silicon draft detector)Resolution Energy Detector type Si (FSDD) 122 eV at half-height at Mn as a Collimatorpolicapillary optics (Focal Spot 15um / 30um) FWHM Detection Element I (22) ~ U (92)Sample type Solid / Liquid/powder, multilayer Chamber size for samples 660 mm X 450 mm X 150 mm / 500 mm X 450 mm X 150 mm Possible distance of moving the slide table 300 mm X 200 mm X 150 mm / 220 mm X 200 mm X 150 mm Sample table size 310 mm X 260 mm Key feature Automatic/ manual scene mode Coating thickness measurement: General, Rh, Pd, Au, Ag, Sn, Ni Measuring the thickness of multilayer thin films (up to 5 layers) Magnification of the camera 40~80xsafety 3-point blocking of the reportExcel, PDF / output Custom Form Key Advantages Microfocus measuring point (<70 microns) using capillary optics Film thickness measurement of multilayer thin films (up to 5 layers) Convenient control of the table Multi-point measurement is possible Remote support via the Internet Application Special measurement of coating thickness, ENEPIG, Pd-Ni, Rh, etc . Coating analysis of automotive parts, Electronic board (PCB), for example, capacitor Analysis of single-layer, multi-layer, alloyed coating The thickness with the composition ratio can be measured over time in the metallization of the alloy
