X-ray fluorescence spectrometer EDX 600 XRF. Specially designed to determine the elements Au Ag Cu Zn Ni Pd Pt Rh Cd Ru in jewelry. The EDX 600 X-ray fluorescence spectrometer analyzer of gold and precious metals can also measure the thickness of layers of coatings and coatings. Budget model.
Specification and conditions of use Content measurement range: 0.1% - 99.99%. Measurement time: About 60-100 seconds. Accuracy: 0.1% (for samples with a material content greater than 96%) Accuracy of coating thickness measurement: 0.01 - 0.05 microns. Measured substances: Solid, powder and liquid. Elements: Au Ag Cu Zn Ni Pd Pt Rh Cd Ru . Weight: about 30 kg. Power: 50W. Voltage: 220 V. Dimensions: 350 x 500 x 400 mm. Relative humidity: <70%. Ambient Temperature: Approximately 15-30°C Configuration Sample compartment: 30 x 30 x 20 cm. Detector: Proportional counter. Preamp and main amplifier. High voltage power supply: Pipe voltage (Maximum): 50 kV; Pipe electric current (Maximum): 1 mA X-ray tube: Tungsten target material. X-ray optical system: Located at the bottom of the device. CCD Camera: 1.4 mega pixels. Collimator : ?3 mm. Safety The EDX 600 XRF X-ray fluorescence spectrometer has double screen covers, and the outer cover includes a lead sheet. Which allows you to prevent leakage of X-ray radiation. The protective cover of the EDX 600 XRF X-ray fluorescence spectrometer is connected to a high-voltage X-ray tube. When the lid is open, the X-ray tube turns off automatically. The X-ray tube is controlled by software, when the connection is broken, the X-ray tube is automatically disconnected.
