The X-ray fluorescence spectrometer allows highly sensitive X-ray analysis of traces of elements, harmful impurities, heavy metals, allowing the analysis of traces of elements with concentrations up to 0.1 ppm, using a special technology of irradiation of the sample with secondary photoelectrons.
Currently, the problem of environmental protection is a global task of saving the environment and human health. Due to the uncontrolled attitude to nature, various foci of pollution began to arise, which increased people's concern about personal health and focusing on the influence of dangerous substances on the human body. The countries of the world issue relevant regulations and rules for the control of the content of dangerous substances in goods, and the permissible values of these substances are becoming less and less. The limit value of lead is 1000 pm according to the RoHS directive adopted by the European Union in July 2006. Recently adopted in the USA, the CPSIA Convention regulates the limit value of lead at 90 ppm. Following the latest regulations adopted for the control of harmful substances, Skyray has specially created the SUPER XRF 1050 model using new RF technologies.
Operational characteristics
The patented Skyray technology is a specialized X-ray source, a variable sample structure for primary excitation and a secondary photoelectron detector, which significantly increases sensitivity and reduces the detection limit.
Modern design, color and structure; electric control of the movement of the top cover makes the device more ergonomic;
The system of collimators with automatic switching of filters allows to solve various analytical tasks;
An analytical camera for large volume samples and a high-resolution CCD camera simplify the operation of the device;
The spectrometer is controlled via a computer with full-featured software.
Technical specifications
The range of measured elements: from S to U
Content range: 0.1ppm to 99.99%
The spectrometer significantly improves the detection limits of hazardous elements compared to a conventional desktop XRF spectrometer.
Repeatability: 0.1%
Stability: 0.1%
Ambient temperature: 15 to 30 °C
Power supply: AC 220V ± 5V. AC.
Standard configuration
Source of X-ray radiation
Sample chamber with electric control of the top cover
Automatic switch of collimators and filters
High-resolution CCD
Si-PIN detector
Circuit detection signal
High and low voltage
Professional RFA software
Scope of application
Analysis of micro-elements in the metallurgical industry, analysis of traces of hazardous elements in metals
Ecological analysis of traces of heavy metals in soil, air, water and other media
Analysis of traces of heavy metal elements in polymer films of the finished product
Analysis of elements harmful to the human body in the precious metals industry
Analysis of traces of rare earth metals
Analysis of the thickness of sub-nanometer deposition in the metal coating industry
Analysis of traces of harmful elements in various consumer goods, as well as toys
