X-ray fluorescence spectrometer EDX 3000D XRF. The EDX 3000D X-ray fluorescence spectrometer is convenient for the analysis of noble, heavy, harmful metals in electronic boards, jewelry, jewelry scrap, flat samples. Operational characteristics Electrocooled Si-PIN semiconductor detector, without the need for liquid nitrogen cooling Automatic filter selection Automatic collimator switch Triple protection of the operator from exposure to X-rays Independent model of matrix effects correction Multivariate nonlinear regression procedure Automatic opening and closing of the sample chamber The software controls the position of the sample on the platform. The minimum displacement is 0.01mm Automatic switching of collimators and filters for different samples Specially designed software, with a friendly user interface Built-in high-resolution CCD, built-in with convenience for users to select the analyzed sample point Attractive and modern design Precise movable automatic platform that precisely adjusts the position of the sample The noise-canceling module SNE significantly improves the certainty and accuracy of measurement Technical Specifications Model: EDX3000D Measured elements: sulfur (S) to uranium (U) Analysis accuracy: 0.05% (above 96%) Analytical range: 1 ppm-99.99% The detection limit of hazardous substances (Cd/Pb/Cr/Hg/Br) is limited in the RoHS directive and can reach 1 ppm Types of samples: powder, solid and liquid Working voltage: AC 110V/220V Possibility of simultaneous analysis: 24 elements Energy resolution: (155 ± 5) eV Measurement time: 60-200 sec Tube voltage: 5-50kV Tube current: 50 -1000µA Ambient temperature: 15 - 30 °C Air humidity: 35% -70% Weight: 110 kg Standard configuration Si-Pin Detector Movable precisely positioned platform High voltage 5 kV-50kV X-ray tube 50uA-1000uA SNE MCA Scope of application, analysis: Detection of hazardous substances in the electrical and electronic industry, electroplating, various materials such as plastics, wood, glass and others.
